太陽能電池粗糙表面量測儀 PV-ARC / 鼎昕科技(股)公司

Application
Antireflective coating (ARC) on textured (poly-)crystalline silicon solar cell

Measure ment
Thickness, Reflectivity, n&k

Wavelength
420 -950 nm(1.3 -3.0 eV) : expandable

Accuracy (thickness measurement on specula sample*
104.5 nm for 104.8 nm SiO2 on c-si, accuracy can be dependent on the quality of film

Thickness range
10 nm ~ 20 μm(depend on sample)

Data acquisition time
< 1s

Focusing of beam
Manual (optional auto-focus) Sample stage: Manual X-Y stage (specify sample size and travel distance), (optional automatic X-Y stage for mapping)

Other
Ellipsometer available

Solar Cells Testing

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