波前感測系統 / 鼎昕科技(股)公司

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Turnkey solutions for demanding wavefront metrology and adaptive optics applications

SL-Sys™ neo
Fully automated wavefront sensingof high NA miniature optics from 1-12mm.

SL-Sys™ liquid
Ensure quality and optimize production of liquid lenses.

AOKit™ - bio
Delve deeper, see better using OCT, multiphoton, confocal and optical microscopes.

LIP™
Augment the measurement capabilities of your HASO™3 sensor to characterize large surfaces.

SH-LTP™
The Shack-Hartmann Long Trace Profiler is ideal for ultra-precise characterization of large surfaces.

e-Xplorer™
Nanometric sensitivity in wafer planeness testing.

Applications
Research, Industrial quality control, Aerospace and defense, Semiconductors, Microscopy and bioimaging, Synchrotrons and FELs.

Wavefront Sensing Metrology

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