LED 測試儀及膜厚量測 / 鼎昕科技(股)公司

LED Tester
For testing the electrical (I-V Curve) and optical characteristics (Spectra, Light Intensity) of the LED chip, Lamp, SMD Type and etc. It tests sample construction through microscope and focuses the light made by constant current input. CIE color coordinates, Measuring Dominant Wavelength (Showing X ,Y value) - Showing Current Light Intensity characteristics graph

Thickness Measurement System
Layer- SiO2, CaF2, MgF2, Photoresist, Polysilicon, Amorphous Silicon, SiNx, TiO2, Sol-Gel, Polyimide, Polymer Film. Substrate- Silicon, Germanium, GaAs, ZnS, ZnSe,Acrylic, Sapphire, Glasses, Polycarbonate, Polymer, Quartz. Up to 4 layers, 20 nm to 50 μm

Hall Effect Measurement System

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