霍爾量測系統 / 鼎昕科技(股)公司

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For measuring Carrier Concentration, Mobility, Resistivity and Hall Coefficient that should be pre-checked in order to grasp the electrical specifications of semiconductor device. Low temperature (77K) test system and magnetic flux density input system. Materials for Measurement Si, SiGe, SiC, GaAs, InGaAs, InP, GaN, TCO (including ITO), AlZnO, FeCdTe, ZnO,etc., all of semiconductors can be measured (N/P-type). Input Current: 1nA ~20mA, Resistivity(Ωㆍcm):10, Concentration (1/cm3): 107~1021, Mobility(cm2/Voltㆍsec): 1~107, Magnetic Flux Density(T): 0.27, 0.31, 0.37, 0.51, 1 HMS3000: 77K and 300K HMS3500: RT ~ 500° C Variable temperature HMS5000: 77K ~ 350K Variable temperature

Hall Effect Measurement System

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